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Analytical Services

LTS recognizes the importance of Analytical Services which aid in quality control and development for the majority of specimens supplied by our factories. With an excellent team of engineers and technicians, we are now offering analytical services for external samples. Our current characterization services include:

Analytical Technique Applications Cost of Analysis
X-Ray Diffraction (XRD) X-ray diffraction is the industry standard for crystallographic analysis including crystal structure, chemical composition, crystal strain, and phase purity of materials. $300.00/sample
Scanning Electron Microscope (SEM) Scanning Electron Microscopy is an extremely versatile imaging tool used mainly to analyze samples at high magnification, and can resolve features down to ~3 nm. Our SEM, equipped with a variable pressure detector (VP-SEM) is capable of analysing non-conductive samples to resolutions of 4 nm. SEM is used primarily for failure analysis, powder size distribution, morphology, and composition. $250.00/sample
Energy Dispersive Spectroscopy (EDS) Energy Dispersive Spectroscopy, typically coupled with Scanning Electron Microscopy (SEM), is used for spatially resolved bulk elemental and compositional analysis. $170.00/sample
Electron Backscattered Diffraction (EBSD) Electron Backscattered Diffraction coupled with SEM, is an imaging technique used to investigate crystallographic properties of materials such as grain size, grain shape, texturing, phase analysis, and spatial distribution of phases. $1600.00/sample
Glow Discharge Mass Spectroscopy (GDMS) Glow Discharge Mass Spectroscopy is a robust, standalone technique used to determine trace elemental analysis down to the parts per billion (ppb). Can be used to measure 72 elements, excluding gases (C, H, O, N, S) $780.00/sample
Inductively Coupled Plasma Mass Spectroscopy (ICP-MS) Inductively Coupled Plasma -Mass Spectrometry is the industry standard for trace elemental analysis with extremely high sensitivity for a wide range of elements. Capable of sub-parts per billion (sub-ppb) detection limits. $460.00/sample
Instrumental Gas Analysis (IGA) Instrumental Gas Analysis is used for trace to bulk gas (C, H, O, N, S) analysis capable of detection limits from parts per million (ppm) to percentage levels. $450.00/sample
Laser Diffraction Particle Size Distribution Analysis (PSD) Laser Diffraction Particle Size Distribution Analysis is an extremely fast technique used to determine powder size distributions and powder properties including agglomeration, aggregation, dispersion, etc. $180.00/sample
X-ray Photoelectron Spectroscopy (XPS) X-ray Photoelectron Spectroscopy is a fast technique for elemental surface characterization including compositional analysis, layer thicknesses, failure analysis, and depth profiling down to percentage levels. $750.00/sample
X-ray Fluorescence Spectroscopy (XRF) X-ray Fluorescence Spectroscopy is an extremely fast, nondestructive surface compositional and elemental analysis technique. Capable of ppm to percentage level resolutions, XRF is used for compositional depth profiling, film thickness measurements, alloy composition validation, and trace element analysis for contamination. $220.00/sample
  • Water Analysis
    GCMS & GC identify organic compounds, pesticides, PCB

Through a partnership with academic and research labs in the Tri-State area (NY-NJ-CT), LTS is pleased to offer extended material characterization, including TEM, SQUID magnetization, LECO, DTC/TGA, Raman scattering, IR-reflectivity, thermal conductivity, and many other analytical services.

We also offer:

  • Non-standard Lab analysis (synchrotron based x-ray diffraction, pair distribution function analysis (EXAFS or x-ray diffraction PDF), soft x-ray absorption, and XPS)
  • Detailed results interpretation, using own raw data or raw data collected by other labs
  • Analytical method development/validation services
  • Consulting / expert testimony.

To learn more about our subsidiary, visit their site at AATec.com