Crystallographic orientation of grains
EBDS is a Scanning electron microscopy-based microstructural analysis technique. As the electron beam from the SEM strikes the sample surface tilted at 70°, some electrons are scattered back toward the surface due to the periodic atomic arrangement in the crystal lattice. Depending on the crystal's orientation, the electrons are diffracted at specific angles characteristic of the lattice planes forming Kikuchi bands. The diffracted electron creates a series of Kikuchi bands in the diffraction pattern. These bands determine the crystallographic orientation of individual grains, phase identification, and grain boundary in polycrystalline materials. EBSD is widely used in material science, metallurgy, geology, and failure analysis to understand the properties and behavior of materials under various conditions.
Detection limits of grain size >100 nm
Want to know more about using Electron back scattered diffraction (EBSD)
