Scanning Electron Microscopy (SEM)

SCANNING ELECTRON MICROSCOPY (SEM) is an extensively used facile analytical tool to collect the high-resolution and depth of field images of sample surfaces. The Hitachi SU3500 has a conventional tungsten emitter Scanning Electron Microscope with variable pressure (VP) SEM capable of both high and low vacuum modes of operation. It is very user-friendly due to the availability of three electron detectors (ET-Secondary, Backscatter, and Low Vacuum Secondary) and numerous options for stage arrangement that hold multiple specimens. The tungsten filament emission instrument offers a performance capability of 7 nm lateral resolution at 3 keV for SE imaging and 10 nm at 5 keV for BSE imaging. It also comes with a Bruker XFlash 6-10 energy dispersive x-ray analysis (EDX) detector for elemental analysis and x-ray mapping.

PROS OF SEM ANALYSIS

• Rapid analysis
• High-resolution images with ultra variable-pressure detector (UVD)
• Large depth of field
• Minimal sample preparation
• Quick identification of elements
• Compatible with insulation and hydrated samples at low-vacuum mode

CONS OF SEM ANALYSIS

• Sample size restrictions
• Etching for planar samples

• Surface sensitivity

   

TECHNICAL SPECIFICATIONS of SEM ANALYSIS

• Acceleration voltage: 1 kV – 30 kV
• Spot intensity: 1-100 nm
• Vacuum level: Low or high vacuum (6 to 650 Pa)
• Working distance: 5- 30 mm
• Tilt angle: 90 degrees
• Large area imaging: 130 mm
• Imaging/Mapping: Yes
• Objective movable aperture: set by manual operation
• 3D roughness profile

Why do you prefer LTS Research Laboratories, Inc. for SEM analysis?

• Fast turnaround time
• Supporting on large volume submission
• Dedicated team to help your projects

• Compatible system with sub-nanometer resolution

   

   

Contact us to know more about using Scanning Electron Microscopy (SEM)

Request a Testing Quote Today