X-ray Diffraction (XRD)

X-ray diffraction (XRD) is an effective nondestructive technique for analyzing crystalline materials. It provides information on the crystal structure, phase, preferred crystal orientation (texture), and other structural parameters like average grain size, crystallinity, strain, and crystal defects. X-ray diffraction peaks arise from the constructive interference of a monochromatic X-ray beam that is diffracted at specific angles by each set of lattice planes in the sample. The intensity of these peaks depends on the distribution of atoms within the lattice. As a result, the X-ray diffraction pattern acts as a unique fingerprint for the periodic atomic arrangement in a material. One can identify the phase of a wide range of crystalline samples by referencing the crystallography open database (COD) of X-ray diffraction patterns.

benefits OF XRD ANALYSIS

• Non-destructive
• Quantitative phase identification
• High sensitivity to crystallinity

• Determining texture and orientation

   

limitations OF X-RAY DIFFRACTION

• Not suitable for amorphous materials
• Depth profile cannot be determined
• Minimum spot size of 20-25 µm

 TECHNICAL SPECIFICATIONS of X-RAY DIFFRACTION

• X-ray source: Cu Kα radiation (λ = 1.54187 Å)
• Goniometer Geometry: Bragg-Brentano (θ-θ system)
• Scan Range (2θ): 5° to 150°
• Minimum Step Size: 0.001°
• Automatic Sample changer: 15 samples
• Detection: All available elements in the crystalline matrix
• Detection Limit: 0.1 to 1 wt%
• Minimum film thickness for phase identification: ~20 Å
• Depth Resolution: Sampling depth between ~20 Å to ~30 µm
• Software for analysis: X'Pert Data Collector, X'Pert HighScore 

LTS Research Laboratories, Inc. offers XRD services to our customers for analyzing various materials, providing fast turnaround times and accurate data reports to ensure you fully understand the information we deliver.

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