High-Resolution Elemental Analysis for Metallic Impurities
Glow Discharge Mass Spectrometry (GDMS) offers unmatched sensitivity for detecting trace metallic contaminants in solid materials. Ideal for applications demanding ultra-low detection limits, GDMS provides a comprehensive chemical profile across a wide range of elements.
This technique operates by sputtering the sample surface with a low-pressure glow discharge plasma, ionizing atoms which are then analyzed by mass spectrometry. As a result, GDMS delivers full-depth, true bulk analysis, making it especially effective for purity certification and contamination control.
Note: GDMS is a destructive method, consuming the entire sample during analysis.
Common Applications:
Purity testing of high-performance materials
Contaminant screening in advanced manufacturing
Trace element analysis in metals, alloys, and oxides
GDMS Deliverables
Suitable Sample Types:
Sputtering targets
Refractory and high-purity metals
Rare earth metals and compounds
Precious metals and alloys
Why Choose GDMS?
Ultra-trace detection: Capable of identifying elements at sub-ppb levels
Broad elemental coverage: Nearly the entire periodic table, excluding hydrogen
Depth-resolved data: Enables profiling of surface layers and coatings
No need for sample preparation or matrix-matched standards
Limitations:
Inability to detect light gases such as Hydrogen (H), Carbon (C), Nitrogen (N), and Oxygen (O₂)
Sample is consumed during the test and cannot be recovered
GDMS Technical Specifications
Signals Detected: Mass resolved positive ions
Elements Covered: All stable isotopes of elements, except H
Sensitivity: parts per billion or ppbw
Contact our team to learn more aboutGlow Discharge Mass Spectroscopy (GDMS)