Chemical Name
HfO2 + SiO2 assembly
Chemical Formula
HFO2/SIO2
Purity
99.95%
Composition
Zr<1500 ppm
Size
12 inch dia x 0.25 inch th.
EINECS Number
Quantity Available
pcs
CAS Number
12055-23-1/14808-60-7
Status
Product ID
SPHFO2SIO212D6T3N5
Hazmat
Catalog Number
12866
Description
As per drawing
Comments
HfO2 and SiO2 are used as alternating high-index and low-index layers in multilayer interference filters, anti-reflective coatings, and high-reflectivity mirrors.
Composite or segmented targets of HfO2 and SiO2 are used in magnetron sputtering to deposit thin films with tailored refractive indices or dielectric properties.
These materials are co-evaporated or evaporated sequentially via electron beam to create optical thin films with high damage thresholds for laser applications.
Used in the fabrication of high-k dielectric gates and passivation layers where a specific silicate interface or graded refractive index is required.
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