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Iridium Silicon (x/y at%)

Sputtering Target

Tags: Precious-metal Sputtering Alloy

Product Specifications

Chemical Name

Chemical Formula

IrSi

Purity

99.95%

Composition

Size

2 inch dia x 0.125 inch th.

EINECS Number

Quantity Available

pcs

CAS Number

Status

Product ID

SPIRSI2D3T3N5

Hazmat

Catalog Number

6452

Description

Comments

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General SpecificationsApplicationsSafety and ShippingCertificates of Analysis (COA)

Element Name

Iridium Silicon (x/y at%)

Symbol

IrSi

Atomic Number

Atomic Weight

220.29 g/mol

Melting Point

1440 °C

Boiling Point

Density

Crystal Structure

Orthorhombic

Color / Appearance

Metallic gray

Thermal Conductivity

Electrical Resistivity

Coefficient of Thermal Expansion

Neutron Cross Section

Electron Configuration

This Product

SPIRSI2D3T3N5

Form

Sputtering Target

Size

2 inch dia x 0.125 inch th.

Quantity Available

pcs

info

Sputtering

Iridium silicide targets are used in sputtering processes to create thin films for Schottky barrier infrared detectors and ohmic contacts in microelectronic devices.

info

Semiconductors

Used as a silicide material for forming high-quality Schottky barriers and stable electrical interfaces in silicon-based semiconductor technology.

warning

HazMat Classification

Not classified as hazardous material.

description

Documentation

Safety Data Sheet (SDS) and Certificate of Analysis (COA) available for download. GHS-compliant labeling provided with all shipments.

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Shipping

Shipped via FedEx Ground or UPS. Hazmat surcharges apply. International orders may require export compliance review. Custom packaging available.

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Quality Assurance

All products supplied with lot-specific COA including ICP-OES elemental analysis, XRD phase identification, and particle size distribution data.

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Certificates of Analysis (COA)

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Iridium Silicon (x/y at%)

Product Specifications

Sputtering

Semiconductors

HazMat Classification

Documentation

Shipping

Quality Assurance

Certificates of Analysis (COA)

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